An edition of Principles of semiconductor network testing (1995)

Principles of semiconductor network testing

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Cover of: Principles of semiconductor network testing by Amir Afshar
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Last edited by MARC Bot
July 18, 2024 | History
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An edition of Principles of semiconductor network testing (1995)

Principles of semiconductor network testing

by

  • 0 Ratings
  • 1 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Butterworth-Heinemann
Language
English
Pages
213

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Previews available in: English

Subjects
Testing, Semiconductors, Integrated circuits

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Edition Availability
Cover of: Principles of Semiconductor Network Testing
Principles of Semiconductor Network Testing
1996, Elsevier Science & Technology Books
in English
Libraries near you: WorldCat
Cover of: Principles of semiconductor network testing
Principles of semiconductor network testing
1995, Butterworth-Heinemann
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Boston

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7874 .A339 1995, TK7874.A339 1995

The Physical Object

Pagination
xiv, 213 p. :
Number of pages
213

ID Numbers

Open Library
OL781473M
Internet Archive
principlessemico00afsh
ISBN 10
0750694726
LCCN
95013386
OCLC/WorldCat
32275164
Library Thing
6555072
Goodreads
343764

Source records

Internet Archive item record
Internet Archive item record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 18, 2024 Edited by MARC Bot import existing book
November 20, 2020 Edited by MARC Bot import existing book
October 7, 2020 Edited by ImportBot import existing book
July 31, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record