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Book Details
Table of Contents
v. 1. Reliability, test and diagnostics [edited by] Edward B. Hakim
v. 2. Integrity assessment and assurance / [edited by] Emiliano Pollino.
Edition Notes
Includes bibliographies and indexes.
Vol. 2. translation of: L'affidabilità dei componenti elettronici a semiconduttore.
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{{cite book|author=Edward B. Hakim |date=1989 |title=Microelectronic reliability. |url=https://archive.org/details/microelectronicr0001unse |publication-place=Norwood, MA |publisher=Artech House |isbn=0-89006-284-6 |lccn=88007814 |oclc=18629793 |ol=2032159M}}