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An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

Cover of: Machine vision systems for inspection and metrology VIII by Bruce G. Batchelor
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Last edited by MARC Bot
July 18, 2024 | History
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An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
252

Subjects

Computer vision Congresses Optical measurements Engineering inspection Industrial applications Automation
Edition Availability
Cover of: Machine vision systems for inspection and metrology VIII
Machine vision systems for inspection and metrology VIII: 21-22 September 1999, Boston, Massachusetts
1999, SPIE
in English

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE ;, v. 3836, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3836.
Genre
Congresses.

Classifications

Dewey Decimal Class
670.42/5
Library of Congress
TA1634 .M3356 1999, TA1634.M3356 1999

The Physical Object

Pagination
vii, 252 p. :
Number of pages
252

Edition Identifiers

Open Library
OL6803717M
ISBN 10
0819434299
LCCN
00266009
OCLC/WorldCat
42709399
Goodreads
768850

Work Identifiers

Work ID
OL19394562W

Source records

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{{cite book|author=Bruce G. Batchelor |date=1999 |title=Machine vision systems for inspection and metrology VIII |publication-place=Bellingham, Wash., USA |publisher=SPIE |isbn=0-8194-3429-9 |lccn=00266009 |oclc=42709399 |ol=6803717M}}