| Record ID | marc_records_scriblio_net/part01.dat:27436234:1361 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part01.dat:27436234:1361?format=raw |
LEADER: 01361cam 2200325 a 4500
001 00266009
003 DLC
005 20000810171337.0
008 000323s1999 waua b 101 0 eng d
010 $a 00266009
020 $a0819434299
035 $a(OCoLC)ocm42709399
040 $aLHL$cLHL$dCUS$dDLC
042 $alccopycat
050 00 $aTA1634$b.M3356 1999
082 00 $a670.42/5$221
245 00 $aMachine vision systems for inspection and metrology VIII :$b21-22 September 1999, Boston, Massachusetts /$cJohn W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc1999.
300 $avii, 252 p. :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE ;$vv. 3836
504 $aIncludes bibliographic references and author index.
650 0 $aComputer vision$vCongresses.
650 0 $aEngineering inspection$xAutomation$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aComputer vision$xIndustrial applications$vCongresses.
700 1 $aMiller, John W. V.
700 1 $aSolomon, Susan Snell.
700 1 $aBatchelor, Bruce G.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3836.