An edition of Three-dimensional imaging and laser-based systems for metrology and inspection II (1996)

Three-dimensional imaging and laser-based systems for metrology and inspection II

20-21 November, 1996, Boston, Massachusetts

by and

Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection II by Kevin G. Harding, Donald J. Svetkoff
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Last edited by MARC Bot
August 6, 2024 | History
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An edition of Three-dimensional imaging and laser-based systems for metrology and inspection II (1996)

Three-dimensional imaging and laser-based systems for metrology and inspection II

20-21 November, 1996, Boston, Massachusetts

by and

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Publish Date
Publisher
SPIE
Language
English
Pages
262

Previews available in: English

Subjects

Moire topography Congresses Lasers Optical measurements Engineering inspection Three-dimensional imaging Imaging systems Three-dimensional display systems Measurement
Edition Availability
Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection II
Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts
1996, SPIE
in English

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Book Details

Edition Notes

Includes bibliographic references and index.

Published in
Bellingham, Wash
Series
Proceedings / SPIE--the International Society for Optical Engineering ;, v. 2909, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 2909.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TK8315 .T468 1996, TK8315.T468 1996

The Physical Object

Pagination
vii, 262 p. :
Number of pages
262

Edition Identifiers

Open Library
OL1016395M
Internet Archive
threedimensional2909unse
ISBN 10
0819423114
LCCN
96069761
OCLC/WorldCat
36373634

Work Identifiers

Work ID
OL23613362W

Source records

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