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Last edited anonymously
April 30, 2008 | History
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Donald J. Svetkoff

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16 works Add another?

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  • Cover of: Optics, illumination, and image sensing for machine vision VIII: 8-9 September 1993, Boston, Massachusetts

    First published in 1993 — 2 editions
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  • Cover of: Optics, illumination, and image sensing for machine vision III: 8-9 November 1988, Cambridge, Massachusetts

    First published in 1989 — 2 editions
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  • Cover of: Optics, illumination, and image sensing for machine vision: 30-31 October 1986, Cambridge, Massachusetts

    First published in 1986 — 2 editions
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  • Cover of: Optics, illumination, and image sensing for machine vision IV: 8-10 November 1989, Philadelphia, Pennsylvania

    First published in 1990 — 2 editions
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  • Cover of: Optics Illumination and Image Sensing for Machine Vision II

    First published in 1988 — 1 edition
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  • Cover of: Optics, Illumination, and Image Sensing for Machine Vision V: Proceedings (Spie Proceedings Series, Vol. 1385)

    First published in 1991 — 1 edition
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  • Cover of: Optics, Illumination, and Image Sensing for Machine Vision VI: 14-15 November 1991 Boston, Massachusetts (Spie Proceedings, Vol 1614)

    First published in 1992 — 1 edition
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  • Cover of: Optics, Illumination, and Image Sensing for Machine Vision VII

    First published in 1992 — 1 edition
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  • Cover of: Imaging and illumination for metrology and inspection: 2-4 November 1994, Boston, Massachusetts

    First published in 1995 — 1 edition
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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection III: 14-15 October, 1997, Pittsburgh, Pennsylvania

    First published in 1997 — 1 edition
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  • Cover of: Optics, illumination, and image sensing for machine vision VI: 14-15 November 1991, Boston, Massachusetts

    First published in 1992 — 1 edition
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  • Cover of: Optics, illumination, and image sensing for machine vision VII: 15-16 November 1992, Boston, Massachusetts

    First published in 1993 — 1 edition
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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts

    First published in 1996 — 1 edition
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  • Cover of: Optics, illumination, and image sensing for machine vision II: 5-6 November 1987, Cambridge, Massachusetts

    First published in 1988 — 1 edition
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  • Cover of: Three-dimensional and unconventional imaging for industrial inspection and metrology: 23-25 October 1995, Philadelphia, Pennsylvania

    First published in 1996 — 1 edition
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  • Cover of: Optics, illumination, and image sensing for machine vision V: 8-9 November 1990, Boston, Massachusetts

    First published in 1991 — 1 edition
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We need a photo of Donald J. Svetkoff

Subjects

Congresses, Computer vision, Optical detectors, Image processing, Three-dimensional display systems, Engineering inspection, Imaging systems, Lasers, Measurement, Three-dimensional imaging, Optical measurements, Industrial applications, Interferometry, Lasers, industrial applications, Mensuration, Moire topography, Optical images, Optical instruments, Optical methods, Triangulation

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ID Numbers

  • OLID: OL3593171A

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History

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April 30, 2008 Created by an anonymous user initial import