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Last edited anonymously
April 30, 2008 | History

Donald J. Svetkoff

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  • Cover of: Optics, illumination, and image sensing for machine vision: 30-31 October 1986, Cambridge, Massachusetts

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  • Cover of: Imaging and illumination for metrology and inspection: 2-4 November 1994, Boston, Massachusetts

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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection III: 14-15 October, 1997, Pittsburgh, Pennsylvania

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  • Cover of: Optics, illumination, and image sensing for machine vision VI: 14-15 November 1991, Boston, Massachusetts

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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts

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April 30, 2008 Created by an anonymous user initial import