An edition of Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry (1994)

Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry

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Certification of a standard reference materia ...
Brian Rennex
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Last edited by MARC Bot
November 21, 2020 | History
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An edition of Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry (1994)

Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Language
English
Pages
55

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Subjects
Silicon, Oxygen content, Measurement, Standards

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Edition Availability
Cover of: Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry
Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry
1994, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Libraries near you: WorldCat
Cover of: Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry
Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry
1994, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references (p. 15).
"Issued August 1994."

Published in
Gaithersburg, MD, Washington, DC
Series
Standard reference materials, NIST special publication ;, 260-121

Classifications

Dewey Decimal Class
602/.18 s, 621.3815/2
Library of Congress
QC100 .U57 no. 260-121

The Physical Object

Pagination
xiv, 55 p. :
Number of pages
55

ID Numbers

Open Library
OL882413M
LCCN
95170387
OCLC/WorldCat
32040786

Source records

Library of Congress MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 21, 2020 Edited by MARC Bot import existing book
December 11, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record