An edition of Characterization of radiation damage by transmission electron microscopy
(2000)
Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
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1
Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
November 21, 2000, Taylor & Francis
Hardcover
in English
075030748X 9780750307482
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Book Details
First Sentence
"Transmission electron microscopy (TEM) is probably the most important and widely used method of characterization in materials science."
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- Created April 29, 2008
- 8 revisions
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| March 28, 2025 | Edited by ImportBot | Redacting ocaids |
| July 29, 2014 | Edited by ImportBot | import new book |
| April 6, 2014 | Edited by ImportBot | Added IA ID. |
| August 6, 2010 | Edited by IdentifierBot | added LibraryThing ID |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |