An edition of Characterization of high Tc materials and devices by electron microscopy
(2000)
Characterization of High Tc Materials and Devices by Electron Microscopy
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Characterization of High Tc Materials and Devices by Electron Microscopy
July 24, 2000, Cambridge University Press
Hardcover
in English
052155490X 9780521554909
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Book Details
First Sentence
"High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale."
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- Created April 29, 2008
- 7 revisions
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| March 28, 2025 | Edited by ImportBot | Redacting ocaids |
| July 28, 2014 | Edited by ImportBot | import new book |
| April 6, 2014 | Edited by ImportBot | Added IA ID. |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |