An edition of Pattern Analysis and Machine Intelligence (2025)

Pattern Analysis and Machine Intelligence

First International Conference, ICPAMI 2024, Shanghai, China, August 30-September 1, 2024, Proceedings

by , , and

Pattern Analysis and Machine Intelligence
Jie Yang, Yuanjie Zheng, Chen ...
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February 17, 2025 | History
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An edition of Pattern Analysis and Machine Intelligence (2025)

Pattern Analysis and Machine Intelligence

First International Conference, ICPAMI 2024, Shanghai, China, August 30-September 1, 2024, Proceedings

by , , and

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Publish Date
Publisher
Springer
Language
English
Pages
500

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Edition Availability
Cover of: Pattern Analysis and Machine Intelligence
Pattern Analysis and Machine Intelligence: First International Conference, ICPAMI 2024, Shanghai, China, August 30-September 1, 2024, Proceedings
2025, Springer
in English

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Book Details

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Library of Congress
TA1634

Edition Identifiers

Open Library
OL57744904M
ISBN 13
9789819633487

Work Identifiers

Work ID
OL42542477W

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Better World Books record

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February 17, 2025 Created by ImportBot Imported from Better World Books record