An edition of Kelvin Probe Force Microscopy (2011)

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

Sascha Sadewasser, Thilo Glatz ...

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Last edited by ImportBot

February 26, 2022 | History

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An edition of Kelvin Probe Force Microscopy (2011)

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Publish Date

2011

Publisher

Springer

Language

English

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Showing 4 featured editions. View all 4 editions?

Edition	Availability
1 Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization Jan 04, 2019, Springer paperback 3030092984 9783030092986	zzzz Not in Library Libraries near you: WorldCat
2 Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization Mar 19, 2018, Springer hardcover 3319756869 9783319756868	zzzz Not in Library Libraries near you: WorldCat
3 Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces Nov 30, 2013, Springer paperback 3642271138 9783642271137	zzzz Not in Library Libraries near you: WorldCat
4 Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces 2011, Springer in English 3642225667 9783642225666	aaaa Not in Library Libraries near you: WorldCat