Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

Machine vision and three-dimensional imaging ...
Kevin G. Harding
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Last edited by MARC Bot
November 15, 2023 | History

Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

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Publish Date
Publisher
SPIE
Language
English
Pages
236

Buy this book

Book Details


Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
SPIE proceedings series ;, v. 4567, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4567.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TA1634 .M316 2002, TA1634.M316 2002

The Physical Object

Pagination
ix, 236 p. :
Number of pages
236

Edition Identifiers

Open Library
OL3584785M
ISBN 10
081944295X
LCCN
2002283059
OCLC/WorldCat
49535329
Goodreads
3508226

Work Identifiers

Work ID
OL19164001W

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November 15, 2023 Edited by MARC Bot import existing book
December 5, 2020 Edited by MARC Bot import existing book
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April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record