An edition of Two- and three-dimensional vision systems for inspection, control, and metrology
(2004)
Two- and three-dimensional vision systems for inspection, control, and metrology
29-30 October 2003, Providence, Rhode Island, USA
by Bruce G. Batchelor
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Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA
2004, SPIE
in English
0819451533 9780819451538
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Includes bibliographical references and author index.
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- Created April 1, 2008
- 7 revisions
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| June 19, 2023 | Edited by ImportBot | import existing book |
| January 8, 2023 | Edited by MARC Bot | import existing book |
| September 9, 2021 | Edited by ImportBot | import existing book |
| December 8, 2020 | Edited by MARC Bot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |