An edition of Hierarchical test generation for digital circuits represented by decision diagrams (2001)

Hierarchical test generation for digital circuits represented by decision diagrams

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Hierarchical test generation for digital circ ...
Jaan Raik, Jaan Raik
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Last edited by MARC Bot
December 7, 2024 | History
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An edition of Hierarchical test generation for digital circuits represented by decision diagrams (2001)

Hierarchical test generation for digital circuits represented by decision diagrams

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Publish Date
Publisher
Tallinn Technical University
Language
English
Pages
108

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Subjects

Digital integrated circuits, Charts, diagrams, Testing, Flow charts, Decision trees
Edition Availability
Cover of: Hierarchical test generation for digital circuits represented by decision diagrams
Hierarchical test generation for digital circuits represented by decision diagrams
2001, Tallinn Technical University
in English

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Book Details

Edition Notes

Originally presented as author's thesis (doctoral)--Tallinn Technical University, 2001.

Includes bibliographical references.

Published in
Tallinn

Classifications

Library of Congress
TK7874.58 .R35 2001

The Physical Object

Pagination
108 p.
Number of pages
108

Edition Identifiers

Open Library
OL31750313M
ISBN 10
9985592492
LCCN
2006530982
OCLC/WorldCat
52608622

Work Identifiers

Work ID
OL24052324W

Source records

Library of Congress MARC record
Harvard University record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 7, 2024 Edited by MARC Bot import existing book
December 16, 2020 Created by MARC Bot Imported from Library of Congress MARC record