An edition of VLSI Design and Test (2018)

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

by , , , , and

Cover of: VLSI Design and Test by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma, Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
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December 29, 2021 | History
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An edition of VLSI Design and Test (2018)

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

by , , , , and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Pages
815

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Subjects

Integrated circuits, very large scale integration
Edition Availability
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Cover of: VLSI Design and Test
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Jan 09, 2018, Springer
paperback
Cover of: VLSI Design and Test
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Jan 26, 2018, Springer
paperback

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Book Details

Edition Notes

Source title: VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science)

Classifications

Library of Congress
QA75.5-76.95

The Physical Object

Format
paperback
Number of pages
815

Edition Identifiers

Open Library
OL28234708M
ISBN 10
9811074690
ISBN 13
9789811074691

Work Identifiers

Work ID
OL20831557W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 29, 2021 Edited by ImportBot import existing book
June 11, 2020 Created by ImportBot Imported from amazon.com record