An edition of VLSI Design and Test (2018)

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

by , , , , and

Cover of: VLSI Design and Test by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma, Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
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Last edited by ImportBot
October 7, 2021 | History
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An edition of VLSI Design and Test (2018)

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

by , , , , and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Pages
775

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Subjects

Integrated circuits, very large scale integration
Edition Availability
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Cover of: VLSI Design and Test
VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Aug 17, 2019, Springer
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Jan 26, 2018, Springer
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Book Details

Edition Notes

Source title: VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (Communications in Computer and Information Science)

Classifications

Library of Congress
QA75.5-76.95

The Physical Object

Format
paperback
Number of pages
775

Edition Identifiers

Open Library
OL28201846M
ISBN 10
9813297662
ISBN 13
9789813297661

Work Identifiers

Work ID
OL20831557W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 7, 2021 Edited by ImportBot import existing book
June 5, 2020 Created by ImportBot Imported from amazon.com record