An edition of Nyquist AD Converters, Sensor Interfaces, and Robustness
(2013)
Nyquist AD Converters, Sensor Interfaces, and Robustness
Advances in Analog Circuit Design, 2012
by Arthur H. M. van Roermund
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This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
- Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
- Presents material in a tutorial-based format;
- Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
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Previews available in: English
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1
Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design 2012
2014, Springer New York
in English
1489997946 9781489997944
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Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012
2013, Springer New York, Imprint: Springer
electronic resource :
in English
1461445876 9781461445876
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Book Details
Table of Contents
<p>Part I: Nyquist A/D Converters
High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes
Dual Residue Pipeline ADC
Time-Interleaved SAR and Slope Converters
GS/s AD Conversion for Broadband Multi-Stream Reception
CMOS Ultra High-Speed Time-Interleaved ADCs
CMOS ADCs for Optical Communications
Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow
Energy-Efficient Capacitive Sensor Interfaces
Interface Circuits for MEMS Microphones
Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments
Part III: Robustness
How Can Chips Live Under Radiation?
TDC and Rad Environments
Matching and Resolution
Matching in Polymer and Effect on Circuit Topologies
Statistical Variability and Reliability in Nano-CMOS Transistors.</p>.
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- Created July 6, 2019
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| February 26, 2022 | Edited by ImportBot | import existing book |
| July 6, 2019 | Created by MARC Bot | Imported from Internet Archive item record |