An edition of Reliability and radiation effects in compound semiconductors
(2010)
Reliability and radiation effects in compound semiconductors
by Allan Johnston
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1
Reliability and radiation effects in compound semiconductors
2010, World Scientific
in English
981427710X 9789814277105
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2
Reliability and Radiation Effects in Compound Semiconductors
2010, World Scientific Publishing Co Pte Ltd
in English
9814277118 9789814277112
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Book Details
Table of Contents
Semiconductor fundamentals
Transistor technologies
Optoelectronics
Reliability fundamentals
Compound semiconductor reliability
Optoelectronic device reliability
Radiation environments
Interactions of radiation with semiconductors
Displacement damage in compound semiconductors
Displacement damage in optoelectronic devices
Radiation damage in optocouplers
Effects from single particles.
Edition Notes
Includes bibliographical references and index.
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History
- Created November 16, 2011
- 4 revisions
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| October 12, 2020 | Edited by MARC Bot | import existing book |
| October 9, 2020 | Edited by ImportBot | import existing book |
| August 2, 2020 | Edited by ImportBot | import existing book |
| November 16, 2011 | Created by LC Bot | Imported from Library of Congress MARC record |