Principles of plasma discharges and materials processing

2nd ed.
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March 28, 2025 | History

Principles of plasma discharges and materials processing

2nd ed.

Authored by two internationally respected pioneers in the field, this book offers a fully integrated, pedagogically consistent presentation of the fundamental physics and chemistry of partially ionized, chemically reactive, low-pressure plasmas and their roles in a wide range of plasma discharges and processes used in thin film processing applications - especially in the fabrication of integrated circuits.

With many fully worked examples, practice exercises, and clear demonstrations of the relationship of plasma parameters to external control parameters and processing results, this book combines the best qualities of a student text and a professional resource.

Publish Date
Publisher
Wiley-Interscience
Language
English
Pages
757

Buy this book

Edition Availability
Cover of: Principles of plasma discharges and materials processing
Principles of plasma discharges and materials processing
2005, Wiley-Interscience
in English - 2nd ed.
Cover of: Principles of plasma discharges and materials processing
Principles of plasma discharges and materials processing
2004, Wiley-Interscience
in English - 2nd ed.
Cover of: Principles of plasma discharges and materials processing
Principles of plasma discharges and materials processing
1994, Wiley
in English

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Book Details


Edition Notes

Published in
Hoboken, NJ

Classifications

Library of Congress
QC

The Physical Object

Pagination
xxxv, 757 p. :
Number of pages
757

Edition Identifiers

Open Library
OL22622469M
ISBN 10
0471720011
LibraryThing
3168126
Goodreads
1004872

Work Identifiers

Work ID
OL3499771W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
March 28, 2025 Edited by ImportBot Redacting ocaids
May 16, 2020 Edited by CoverBot Added new cover
April 6, 2014 Edited by ImportBot Added IA ID.
August 19, 2010 Edited by IdentifierBot added LibraryThing ID
November 17, 2008 Created by ImportBot Imported from University of Toronto MARC record