An edition of IEEE standard test access port and boundary-scan architecture (1993)

IEEE standard test access port and boundary-scan architecture.

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Last edited by WorkBot
December 15, 2009 | History
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An edition of IEEE standard test access port and boundary-scan architecture (1993)

IEEE standard test access port and boundary-scan architecture.

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Publish Date
Publisher
Institute of Electrical and Electronics Engineers
Language
English

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Edition Availability
Cover of: IEEE standard test access port and boundary-scan architecture.
IEEE standard test access port and boundary-scan architecture.
1993, Institute of Electrical and Electronics Engineers
in English
Cover of: IEEE standard test access port and boundary-scan architecture
IEEE standard test access port and boundary-scan architecture
1993, Institute of Electrical and Electronics Engineers
in English

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Book Details

Edition Notes

Sponsored by the Test Technology Standards Committee.

At head of title: IEEE Std 1149.1-1990 (Includes IEEE Std 1149.1a-1993).

Published in
New York

Classifications

Dewey Decimal Class
621.38153

Edition Identifiers

Open Library
OL21990823M
ISBN 10
1559373504

Work Identifiers

Work ID
OL6927164W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 15, 2009 Edited by WorkBot link works
November 5, 2008 Created by ImportBot Imported from Talis record