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Edition | Availability |
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1
Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California
1994, SPIE
in English
0819414913 9780819414915
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2
Integrated Circuit Metrology Inspection and Process Control Viii/V 2196
May 1994, Society of Photo Optical
Paperback
in English
0819414913 9780819414915
|
zzzz
Libraries near you:
WorldCat
|
3
Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California
1994, SPIE
in English
0819414913 9780819414915
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Edition Notes
"Papers in this conference ... were presented at the SPIE Microlithography Symposium"--P. ix.
Includes bibliographical references and index.
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- Created November 2, 2008
- 3 revisions
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July 31, 2019 | Edited by MARC Bot | associate edition with work OL8554365W |
April 13, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
November 2, 2008 | Created by ImportBot | Imported from University of Toronto MARC record |