An edition of Defect control in semiconductors
(1990)
Defect control in semiconductors
proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989
by International Conference on the Science ...
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Publish Date
1990
Language
English
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Previews available in: English
Subjects
Congresses, Defects, Materials, Semiconductors| Edition | Availability |
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1
Defect control in semiconductors: proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989
1990, North-Holland, Distributors for the U.S. and Canada, Elsevier Science Pub. Co.
in English
0444884297 9780444884299
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Includes bibliographical references and indexes.
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- Created April 1, 2008
- 5 revisions
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| January 14, 2023 | Edited by ImportBot | import existing book |
| June 1, 2022 | Edited by ImportBot | import existing book |
| November 11, 2020 | Edited by MARC Bot | import existing book |
| December 12, 2009 | Edited by WorkBot | link works |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |