Characterization of high Tc materials and devices by electron microscopy

Digitally printed 1st pbk. version.
Characterization of high Tc materials and dev ...
Stephen J. Pennycook
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October 4, 2021 | History

Characterization of high Tc materials and devices by electron microscopy

Digitally printed 1st pbk. version.

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Publish Date
Language
English
Pages
391

Buy this book

Edition Availability
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
November 23, 2006, Cambridge University Press
Paperback in English - New Ed edition
Cover of: Characterization of high Tc materials and devices by electron microscopy
Characterization of high Tc materials and devices by electron microscopy
2006, Cambridge University Press
in English - Digitally printed 1st pbk. version.

Add another edition?

Book Details


Edition Notes

Originally published: 2000.

Includes bibliographical references.

Published in
Cambridge, New York

Classifications

Dewey Decimal Class
537.6/23/0284
Library of Congress
QC611.98.H54 C43 2006, QC611.98.H54 C43 20

The Physical Object

Pagination
xii, 391 p. :
Number of pages
391

Edition Identifiers

Open Library
OL17885818M
ISBN 10
0521031702
ISBN 13
9780521031707
LCCN
2007271603
Goodreads
4174170

Work Identifiers

Work ID
OL18706844W

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