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| Edition | Availability |
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1
Characterization of High Tc Materials and Devices by Electron Microscopy
November 23, 2006, Cambridge University Press
Paperback
in English
- New Ed edition
0521031702 9780521031707
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2
Characterization of high Tc materials and devices by electron microscopy
2006, Cambridge University Press
in English
- Digitally printed 1st pbk. version.
0521031702 9780521031707
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Book Details
Edition Notes
Originally published: 2000.
Includes bibliographical references.
