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Publish Date
2001
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
81
Buy this book

Edition | Availability |
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1
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
2
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
aaaa
|
3
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
Book Details
Edition Notes
"August 2, 2001."
Shipping list no.: 2002-0384-M.
Includes bibliographical references (p. 42-44).
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 1 microfiche : negative.
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History
- Created September 30, 2008
- 3 revisions
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August 6, 2012 | Edited by VacuumBot | Updated format '[microform] /' to 'Microform'; cleaned up pagination |
December 15, 2009 | Edited by WorkBot | link works |
September 30, 2008 | Created by ImportBot | Imported from Oregon Libraries MARC record |