An edition of Distributed testing of a device-level interface specification for a metrology system (2002)

Distributed testing of a device-level interface specification for a metrology system

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Distributed testing of a device-level interfa ...
John Horst ... [et al.].
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Last edited by MARC Bot
September 5, 2024 | History
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An edition of Distributed testing of a device-level interface specification for a metrology system (2002)

Distributed testing of a device-level interface specification for a metrology system

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  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
19

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Subjects
Testing, Metrology, Coordinate measuring machines, Computer software

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Edition Availability
Cover of: Distributed testing of a device-level interface specification for a metrology system
Distributed testing of a device-level interface specification for a metrology system
2002, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform in English
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Libraries near you: WorldCat

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Book Details

Edition Notes

"January 2002."

Shipping list no.: 2002-0384-M.

Includes bibliographical references (p. 19).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.

Published in
Gaithersburg, MD
Series
NISTIR -- 6851.

The Physical Object

Format
Microform
Pagination
19 p.
Number of pages
19

ID Numbers

Open Library
OL17607544M
OCLC/WorldCat
50263005

Source records

Oregon Libraries MARC record
harvard_bibliographic_metadata record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 5, 2024 Edited by MARC Bot import existing book
February 6, 2019 Edited by MARC Bot import existing book
August 5, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; cleaned up pagination
April 25, 2009 Edited by ImportBot add OCLC number
September 29, 2008 Created by ImportBot Imported from Oregon Libraries MARC record