Patterning of material layers in submicron region

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Last edited by MARC Bot
July 14, 2024 | History

Patterning of material layers in submicron region

Economic success of multimegabit memories has upheld the evolution of technology for creating submicron structures. These structures also constitute neural networks, nanomachines, smart sensors, quantum devices and so on. Patterning of Material Layers in Submicron Region offers, in a single ensemble, state-of-the-art information on various lithographic and delineation techniques along with their applications.

It invokes the interests of the reader into the wonderland of nanominiaturization for industrial, biological and fundamental applications. Its contents portray the advent and relevance of submicron structures and proffer a perception of materials, modules and schemes for preparing them.

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Patterning of Material Layers in Submicron Region puts forth a coherent and comprehensive treatise of three submicron patterning technologies viz. electron beam, ion beam and X-ray lithography. These technologies are undergoing rapid individual developments and are vying with each other to become the chief writing tool of multitrillion dollar microelectronic industry.

This book is endowed with quantitative features of the operational ingredients such as sources, resists, masks, writing/aligning/scanning techniques and commercial/captive systems. It is profusely illustrated with layout diagrams, flowcharts, analyses and SEM pictures of novel results to ensure lucidity. The book also presents various recent developments such as X-ray mask preparation, plasma developing resists and compact synchrotron with statistical details.

  1. Implications, scope and trend of these technologies are demonstrated through significant results followed by brief futuristic projections of the activities and devices. The book aims to meet the requirements of modernizing postgraduate sylabi and enhancing the capabilities of R&D engineers as well as capital equipment manufacturer. It also covers useful material for technology optimiser and device & systems planner.
Publish Date
Publisher
J. Wiley
Language
English
Pages
183

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Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and index.

Published in
New York

Classifications

Dewey Decimal Class
621.3815/31
Library of Congress
TK7872.M3 P38 1993, TK7872.M3P38 1993

The Physical Object

Pagination
xii, 183 p. :
Number of pages
183

Edition Identifiers

Open Library
OL1731542M
ISBN 10
0470220635, 8122405614
LCCN
92036072
OCLC/WorldCat
27036323
Goodreads
4708146

Work Identifiers

Work ID
OL4308037W

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