An edition of Instrumentation, metrology, and standards for nanomanufacturing
(2007)
Instrumentation, metrology, and standards for nanomanufacturing
29-30 August 2007, San Diego, California, USA
by John Allgair
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Instrumentation, metrology, and standards for nanomanufacturing: 29-30 August 2007, San Diego, California, USA
2007, SPIE
in English
0819467960 9780819467966
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Includes bibliographical references and author index.
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- Created September 13, 2008
- 8 revisions
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| November 14, 2020 | Edited by MARC Bot | import existing book |
| October 9, 2020 | Edited by ImportBot | import existing book |
| August 2, 2020 | Edited by ImportBot | import existing book |
| February 15, 2012 | Edited by LC Bot | import new book |
| September 13, 2008 | Created by ImportBot | Imported from Western Washington University MARC record |