An edition of Asian Test Symposium (1999)

Asian Test Symposium

Proceedings Shanghai, China 1999

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Cover of: Asian Test Symposium by Institute of Electrical and Electronics Engineers, Institute of Electrical and Electronics Engineers
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Last edited by MARC Bot
July 18, 2024 | History
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An edition of Asian Test Symposium (1999)

Asian Test Symposium

Proceedings Shanghai, China 1999

by

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Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
406

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Previews available in: English

Subjects

Computers, Congresses, Electronic digital computers, Circuits, Testing, Electronic circuits, Fault-tolerant computing
Edition Availability
Cover of: Asian Test Symposium
Asian Test Symposium: Proceedings Shanghai, China 1999
January 1999, Institute of Electrical & Electronics Enginee
Hardcover in English

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Book Details

Classifications

Library of Congress
TK7888.4 .A85 1999

The Physical Object

Format
Hardcover
Number of pages
406

Edition Identifiers

Open Library
OL10966463M
Internet Archive
asiantestsymposi0000unse
ISBN 10
0769503152
ISBN 13
9780769503158
OCLC/WorldCat
42951492
Goodreads
7023647

Work Identifiers

Work ID
OL8209627W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 18, 2024 Edited by MARC Bot import existing book
December 9, 2022 Edited by ImportBot import existing book
August 26, 2021 Edited by Charles Horn merge authors
January 24, 2021 Edited by ImportBot import existing book
April 30, 2008 Created by an anonymous user Imported from amazon.com record