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Last edited by BWBImportBot
May 14, 2020 | History

Philippe Pougnet

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  • Cover of: Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

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  • Cover of: Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method

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  • Cover of: Nanometer-Scale Defect Detection Using Polarized Light

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  • Cover of: Systèmes Mécatroniques Embarqués

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  • Cover of: Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability

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  • Cover of: Embedded Mechatronic Systems, Volume 2 Vol. 2: Analysis of Failures, Modeling, Simulation and Optimization

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  • Cover of: Embedded Mechatronic Systems Vol. 1: Analysis of Failures, Predictive Reliability

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  • Cover of: Embedded Mechatronic Systems Vol. 2: Analysis of Failures, Modeling, Simulation and Optimization

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  • Cover of: Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization

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  • Cover of: Embedded Mechatronic Systems, Volume 2: Analysis of Failures, Modeling, Simulation and Optimization

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  • Cover of: Embedded Mechatronic Systems, Volume 1 Vol. 1: Analysis of Failures, Predictive Reliability

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  • Cover of: Embedded Mechatronic Systems, Volume 1

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