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Last edited by LC Bot
February 15, 2012 | History
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Richard C. Kullberg

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  • Cover of: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII: 28-29 January 2009, San Jose, California, United States

    First published in 2009 — 1 edition
    Not in Library

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  • Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IX: 25-26 January 2010, San Francisco, California, United States

    First published in 2010 — 1 edition
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Subjects

Congresses, Microelectromechanical systems, Microelectronic packaging, Reliability, Testing

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ID Numbers

  • OLID: OL7079302A

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History

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February 15, 2012 Created by LC Bot import new book