Born | 1937 |
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Born | 1937 |
Subjects
Reflection (Optics), Mathematical models, Analysis, Congresses, Dielectrics, Electromagnetic waves, Measurement, Semiconductors, Silicon, Spectrum analysis, Surfaces (Technology), TestingID Numbers
- OLID: OL4719562A
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September 15, 2008 | Created by ImportBot | Imported from Miami University of Ohio MARC record |