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Last edited by RenameBot
August 24, 2008 | History

Martin G. Buehler

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6 works Add another?

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  • Cover of: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements: videotape script.

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  • Cover of: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script

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  • Cover of: Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of silicon

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  • Cover of: Microelectronic test patterns: an overview

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  • Cover of: Solid state radiation dosimeters for space and medical applications

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  • Cover of: Planar test structures for characterizing impurities in silicon

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History

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August 24, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import