An edition of Microelectronic test patterns (1974)

Microelectronic test patterns

an overview

by

Microelectronic test patterns
Martin G. Buehler, Martin G. B ...
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Last edited by MARC Bot
July 12, 2024 | History
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An edition of Microelectronic test patterns (1974)

Microelectronic test patterns

an overview

by

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Publish Date
Publisher
National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Language
English
Pages
19

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Subjects

Electronic apparatus and appliances, Integrated circuits, Testing

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Edition Availability
Cover of: Microelectronic test patterns
Microelectronic test patterns: an overview
1974, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
in English
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Book Details

Edition Notes

Bibliography: p. 11.
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."

Published in
[Washington]
Series
Semiconductor measurement technology, NBS special publication 400-6, NBS special publication ;, 400-6.

Classifications

Dewey Decimal Class
389/.08 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-6, TK7874 .U57 no. 400-6

The Physical Object

Pagination
19 p.
Number of pages
19

ID Numbers

Open Library
OL5051537M
LCCN
74013001
OCLC/WorldCat
979298

Source records

Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 12, 2024 Edited by MARC Bot import existing book
October 9, 2020 Edited by MARC Bot import existing book
December 14, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record