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An edition of 17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California (1999)

17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California

Proceedings (Ieee Vlsi Test Symposium)

by

Cover of: 17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California by IEEE VLSI Test Symposium, IEEE VLSI Test Symposium
17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California by IEEE VLSI Test Symposium, IEEE VLSI Test Symposium
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Last edited by MARC Bot
July 16, 2024 | History
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An edition of 17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California (1999)

17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California

Proceedings (Ieee Vlsi Test Symposium)

by

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Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
488

Subjects

Integrated circuits Very large scale integration Testing Congresses
Edition Availability
Cover of: 17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California
17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California : Proceedings (Ieee Vlsi Test Symposium)
April 1999, Institute of Electrical & Electronics Enginee
Paperback in English
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Book Details

The Physical Object

Format
Paperback
Number of pages
488
Dimensions
10.5 x 8.2 x 1.2 inches
Weight
2.6 pounds

Edition Identifiers

Open Library
OL10966419M
ISBN 10
076950146X
ISBN 13
9780769501468
OCLC/WorldCat
41566688

Work Identifiers

Work ID
OL9507018W

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