An edition of Physical aspects of electron microscopy and microbeam analysis (1975)

Physical aspects of electron microscopy and microbeam analysis

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Cover of: Physical aspects of electron microscopy and microbeam analysis by Benjamin M. Siegel, Benjamin M. Siegel
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Last edited by MARC Bot
January 11, 2023 | History
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An edition of Physical aspects of electron microscopy and microbeam analysis (1975)

Physical aspects of electron microscopy and microbeam analysis

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Publish Date
Publisher
Wiley
Language
English
Pages
474

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Previews available in: English

Subjects

Electron microscopy, Microchemistry, Microprobe analysis, Electron microscopes, Electron Probe Microanalysis, Electron Microscopy

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Edition Availability
Cover of: Physical aspects of electron microscopy and microbeam analysis
Physical aspects of electron microscopy and microbeam analysis
1975, Wiley
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
"A Wiley biomedical-health publication."

Published in
New York

Classifications

Dewey Decimal Class
535/.3325
Library of Congress
QH212.E4 S53 1975, QH212.E4

The Physical Object

Pagination
xiii, 474 p. :
Number of pages
474

ID Numbers

Open Library
OL5058935M
Internet Archive
physicalaspectso0000sieg
ISBN 10
0471790206
LCCN
74022483
OCLC/WorldCat
1085871
Goodreads
3646414

Source records

amazon.com record
Library of Congress MARC record
Internet Archive item record
Better World Books record
Promise Item
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
January 11, 2023 Edited by MARC Bot import existing book
October 18, 2022 Edited by ImportBot import existing book
March 19, 2019 Edited by ImportBot import existing book
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page