An edition of Microelectronic test patterns (1974)

Microelectronic test patterns

an overview

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Microelectronic test patterns
Martin G. Buehler
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Last edited by Open Library Bot
December 5, 2010 | History
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An edition of Microelectronic test patterns (1974)

Microelectronic test patterns

an overview

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Language
English
Pages
19

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Subjects
Electronic apparatus and appliances, Integrated circuits, Testing

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Edition Availability
Cover of: Microelectronic test patterns
Microelectronic test patterns: an overview
1974, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Bibliography: p. 11.
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."

Published in
[Washington]
Series
Semiconductor measurement technology, NBS special publication 400-6, NBS special publication ;, 400-6.

Classifications

Dewey Decimal Class
389/.08 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-6, TK7874 .U57 no. 400-6

The Physical Object

Pagination
19 p.
Number of pages
19

ID Numbers

Open Library
OL5051537M
LCCN
74013001
OCLC/WorldCat
979298

Source records

Library of Congress MARC record
marc_columbia MARC record

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History

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December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page