An edition of VLSI Test Symposium (Vts 2000) Proceedings (2000)

VLSI Test Symposium (Vts 2000) Proceedings

by

Cover of: VLSI Test Symposium (Vts 2000) Proceedings by IEEE Computer Society, IEEE Computer Society
Locate

My Reading Lists:

Create a new list

Check nearby libraries

Buy this book

Last edited by MARC Bot
July 9, 2024 | History
Edit
An edition of VLSI Test Symposium (Vts 2000) Proceedings (2000)

VLSI Test Symposium (Vts 2000) Proceedings

by

This work doesn't have a description yet. Can you add one?

Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
478

Check nearby libraries

Buy this book

Subjects

Integrated circuits Very large scale integration Testing Congresses
Edition Availability
Cover of: VLSI Test Symposium (Vts 2000) Proceedings
VLSI Test Symposium (Vts 2000) Proceedings
May 2000, Institute of Electrical & Electronics Enginee
Unknown Binding in English
Cover of: VLSI Test Symposium (Vts 2000) Proceedings
VLSI Test Symposium (Vts 2000) Proceedings
May 2000, Institute of Electrical & Electronics Enginee
Paperback in English

Add another edition?

Book Details

Classifications

Library of Congress
TK7874 .I326 2000

The Physical Object

Format
Unknown Binding
Number of pages
478

Edition Identifiers

Open Library
OL10966554M
ISBN 10
0769506151
ISBN 13
9780769506159
OCLC/WorldCat
44052593

Work Identifiers

Work ID
OL6927294W

Source records

Community Reviews (0)

No community reviews have been submitted for this work.

Lists

Download catalog record: RDF / JSON