Electronic characterization of defects in narrow gap semiconductors

comparison of electronic energy levels and formation energies in Mercury Cadmium Telluride Mercury Zinc Telluride and Mercury Zinc Selenide, semi-annual report, September 19, 1994 to March 19, 1995

Electronic characterization of defects in nar ...
James D. Patterson, James D. P ...
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December 3, 2010 | History

Electronic characterization of defects in narrow gap semiconductors

comparison of electronic energy levels and formation energies in Mercury Cadmium Telluride Mercury Zinc Telluride and Mercury Zinc Selenide, semi-annual report, September 19, 1994 to March 19, 1995

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Cover of: Electronic characterization of defects in narrow gap semiconductors
Cover of: Electronic characterization of defects in narrow gap semiconductors
Electronic characterization of defects in narrow gap semiconductors: final report, November 25, 1992 to November 25, 1994
1994, [National Aeronautics and Space Administration], George C. Marshall Space Flight Center, National Technical Information Service, distributor
Microform in English

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Book Details


Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 95-0749-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.

Published in
[Washington, D.C, Springfield, Va
Series
NASA contractor report -- NASA CR-197835.

The Physical Object

Format
Microform
Pagination
1 v.

Edition Identifiers

Open Library
OL15413843M

Work Identifiers

Work ID
OL6592570W

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December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page