An edition of Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density (1982)

Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density

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Production-compatible microelectronic test st ...
Russell, T. J.
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Last edited by Open Library Bot
December 3, 2010 | History
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An edition of Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density (1982)

Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density

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  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
Language
English
Pages
36

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Subjects
Electric charge and distribution, Microelectronics, Oxides, Thermal properties

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Edition Availability
Cover of: Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
1982, U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
in English
  • Not in Library
Cover of: Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
1982, U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
in English
Cover of: Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
1982, U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
in English
Cover of: Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
1982, U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor
in English

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Book Details

Edition Notes

"January 1982."

Includes bibliographical references

Published in
Washington, DC, [Springfield, VA
Series
NBSIR -- 81-2413

The Physical Object

Pagination
iv, 36 p. :
Number of pages
36

ID Numbers

Open Library
OL14848238M

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December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page