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An edition of Semiconductor measurement technology (1976)

Semiconductor measurement technology

permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

by

Semiconductor measurement technology
James M. Kenney, James M. Kenn...
Semiconductor measurement technology by James M. Kenney, James M. Kenney
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Last edited by Open Library Bot
December 5, 2010 | History
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An edition of Semiconductor measurement technology (1976)

Semiconductor measurement technology

permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

by

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Publish Date
Publisher
U.S. Dept. of Commerce, National Bureau of Standards
Language
English
Pages
26

Subjects

Diodes, Schottky-barrier Effect of radiation on Microwave measurements Mixing circuits
Edition Availability
Cover of: Semiconductor measurement technology
Semiconductor measurement technology: permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes
1976, U.S. Dept. of Commerce, National Bureau of Standards
in English
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Book Details

Edition Notes

Published in
Washington
Series
NBS special publication ; 400-7, NBS special publication ;, 400-7.

Classifications

Dewey Decimal Class
602/.1 s, 621.3815/22
Library of Congress
QC100 .U57 no. 400-7, TK7871.89 .U57 no. 400-7

The Physical Object

Pagination
26 p. :
Number of pages
26

Edition Identifiers

Open Library
OL4878215M
LCCN
76005868

Work Identifiers

Work ID
OL6289675W

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