Spectroscopic Ellipsometry for the in-Situ Investigation of Atomic Layer Depositions

Spectroscopic Ellipsometry for the in-Situ In ...
Varun Sharma, Varun Sharma
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Last edited by ImportBot
September 17, 2023 | History

Spectroscopic Ellipsometry for the in-Situ Investigation of Atomic Layer Depositions

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Publish Date
Publisher
GRIN Verlag GmbH
Language
English

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Book Details


The Physical Object

Pagination
112
Weight
0.155

Edition Identifiers

Open Library
OL49557270M
ISBN 13
9783656923152

Work Identifiers

Work ID
OL36692467W

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