The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages

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Last edited by MARC Bot
July 17, 2024 | History

The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages

1 edition
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

"This book is motivated by the need to understand and predict the complex stress distributions, transfer mechanisms, warpage, and potential failures arising from the encapsulation of devices in plastic. Failures like delaminations, package cracking, and metal shift occur due to the build up of residual stress and warpage in the packages because of the TCE mismatch between the package materials as the package cools from its molding temperature to room temperature.

The correct use of finite element tools for these problems is emphasised."--BOOK JACKET.

Publish Date
Publisher
Springer
Language
English
Pages
134

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Edition Availability
Cover of: The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages
The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages
April 30, 1999, Springer
Hardcover in English - 1 edition

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Book Details


Classifications

Library of Congress
TK7874 .K413 1999, TA1-2040

The Physical Object

Format
Hardcover
Number of pages
134
Dimensions
9.5 x 6.3 x 0.6 inches
Weight
14.4 ounces

ID Numbers

Open Library
OL7810250M
ISBN 10
0792384857
ISBN 13
9780792384854
LCCN
99013260
OCLC/WorldCat
40830097
Goodreads
2783973

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History

Download catalog record: RDF / JSON
July 17, 2024 Edited by MARC Bot import existing book
December 29, 2021 Edited by ImportBot import existing book
November 30, 2020 Edited by MARC Bot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page