Growth and characterisation of thin films of zinc sulphide on silicon

a comparative study of the electrical and structural properties of films prepared in ultra high vacuum conditions---.

Growth and characterisation of thin films of ...
David Sands, David Sands
Growth and characterisation of thin films of zinc sulphide on silicon by David Sands, David Sands
Nearby Libraries

Only you can see this

Save Note
Last edited by WorkBot
February 14, 2010 | History

Growth and characterisation of thin films of zinc sulphide on silicon

a comparative study of the electrical and structural properties of films prepared in ultra high vacuum conditions---.

This work doesn't have a description yet. Can you add one?

Publish Date
Language
English

Book Details


Edition Notes

Ph.D.thesis.Typescript.

Published in
Bradford
Series
Theses

Edition Identifiers

Open Library
OL13980714M

Work Identifiers

Work ID
OL3490163W

Source records

Community Reviews (0)

No community reviews have been submitted for this work.

Lists

Download catalog record: RDF / JSON