2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

2022 IEEE International Conference on Metrolo ...
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January 17, 2023 | History

2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

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Publisher
IEEE
Language
English

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Edition Identifiers

Open Library
OL46120386M
ISBN 13
9781665485753

Work Identifiers

Work ID
OL34058352W

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