An edition of 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto (1997)

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

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Cover of: 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto by International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan), International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan)
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Last edited by Open Library Bot
April 28, 2010 | History
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An edition of 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto (1997)

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

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Publish Date
Publisher
Institute of Electrical and Electronics Engineers
Language
English
Pages
124

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Subjects

Semiconductors Congresses Statistical methods Characterization Measurement
Edition Availability
Cover of: 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
1997, Institute of Electrical and Electronics Engineers
in English

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Book Details

Edition Notes

Includes bibliographical references.
"IEEE cat. no. 97TH8246."

Published in
[New York]

Classifications

Library of Congress
TK7871.85 .I5844 1997

The Physical Object

Pagination
vi, 124 p. :
Number of pages
124

Edition Identifiers

Open Library
OL1020414M
ISBN 10
0780337379, 0780337387
LCCN
96079035
OCLC/WorldCat
38037384

Work Identifiers

Work ID
OL3371584W

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