Testing and testable design of high-density random-access memories

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Last edited by Open Library Bot
April 28, 2010 | History

Testing and testable design of high-density random-access memories

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Publish Date
Publisher
Kluwer Academic
Language
English
Pages
386

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Previews available in: English

Book Details


Edition Notes

Includes bibliographical references (p. [367]-381) and index.

Published in
Boston, Mass
Series
Frontiers in electronic testing

Classifications

Dewey Decimal Class
621.39/732
Library of Congress
TK7895.M4 M38 1996

The Physical Object

Pagination
xxxviii, 386 p. :
Number of pages
386

Edition Identifiers

Open Library
OL989235M
Internet Archive
testingtestabled0000mazu
ISBN 10
0792397827
LCCN
96027507
Goodreads
2394478

Work Identifiers

Work ID
OL3283165W

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History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 13, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page