An edition of A novel approach for correlating capacitance data with performance during thin-film device stress studies (2011)

A novel approach for correlating capacitance data with performance during thin-film device stress studies

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A novel approach for correlating capacitance ...
Rebekah L. Graham
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Last edited by MARC Bot
December 12, 2022 | History
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An edition of A novel approach for correlating capacitance data with performance during thin-film device stress studies (2011)

A novel approach for correlating capacitance data with performance during thin-film device stress studies

preprint

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
National Renewable Energy Laboratory
Language
English

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Subjects
Photovoltaic cells, Research, Electric capacity, Thin films, Performance, Data mining, Computer programs

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Edition Availability
Cover of: A novel approach for correlating capacitance data with performance during thin-film device stress studies
A novel approach for correlating capacitance data with performance during thin-film device stress studies: preprint
2011, National Renewable Energy Laboratory
electronic resource : in English
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Book Details

Edition Notes

Title from title screen (viewed September 19, 2011).

"August 2011."

"Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."

Includes bibliographical references (p. 8).

Sponsored by National Renewable Energy Laboratory DE-AC36-08GO28308

Published in
Golden, CO
Series
NREL/CP -- 5200-52392, Conference paper (National Renewable Energy Laboratory (U.S.)) -- NREL/CP-5200-52392.

The Physical Object

Format
[electronic resource] :
Pagination
1 online resource (8 p.)

ID Numbers

Open Library
OL43879837M
OCLC/WorldCat
753575659

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