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Subjects
Congresses, Integrated circuits, Testing, DefectsShowing 1 featured edition. View all 1 editions?
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Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
1995, Institute of Electrical and Electronics Engineers
in English
0780327977 9780780327979
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Book Details
Edition Notes
Includes bibliographical references and index.
"IPFA '95 proceedings"--Cover.
"IEEE catalog no. 95TH8113"--Cover.
"27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover.
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Feedback?April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
February 12, 2010 | Edited by WorkBot | add more information to works |
December 10, 2009 | Created by WorkBot | add works page |