An edition of Built-In Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design
(2023)
Built-In Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design
A Self-Test, Self-diagnosis, and Self-repair-based Approach
by Xiaowei Li, Guihai Yan, and Cheng Liu
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Built-In Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design: A Self-Test, Self-diagnosis, and Self-repair-based Approach
2023, Springer
in English
9811985502 9789811985508
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| November 17, 2022 | Created by ImportBot | import new book |